Through-Silicon Via process module with backside metallization and redistribution layer within a 130 nm SiGe BiCMOS technology
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M. Kaynak | D. Wolansky | A. Göritz | M. Wietstruck | A. Mai | M. Fraschke | M. Lisker | S. Marschmeyer | A. Krüger | P. Kulse | M. Inac | T. Voß