Transport behavior of commercially available 100-Ω standard resistors
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Giorgio Boella | Bernd Schumacher | Beat Jeckelmann | Ove Gunnarsson | Randolph E. Elmquist | Jonathan M. Williams | Per-Otto Hetland | Peter Warnecke | W. Poirier | I. Delgado | Z. Msimang | David Inglis | Alexandre Satrapinski
[1] P. Warnecke,et al. Hysteretic and reversible anomalies of resistance alloys , 1998, 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254).
[2] Kwang Min Yu,et al. Effect of temporary temperature change on drift rate of KRISS legal ohm , 1998, 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254).
[3] Blaise Jeanneret,et al. Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM , 1995 .
[4] G. Boella,et al. Change of the working temperature of the IEN primary group of standard resistors , 1996 .
[5] R B Frenkel. Statistical procedures for comparing realizations of physical units using artefact standards, including an estimation of transportation effects , 1999 .
[6] F. Piquemal,et al. Comparison of quantum Hall effect resistance standards of the BNM/LCIE and the BIPM , 1994 .
[7] T. J. Witt,et al. Comparison of quantum Hall effect resistance standards of the NIST and the BIPM , 1997 .
[8] T. J. Witt,et al. Report on the 1990 International Comparison of 1 Ω and 10 kΩ Resistance Standards at the BIPM , 1992 .