A Bayes Reliability Growth Model for A Development Testing Program

The problem of estimating the reliability of a system during development is considered. The development process has several stages at each stage binomial test data are obtained by testing a number of such systems on a success/fail basis. Marginal posterior distributions are derived under the assumption that the development process constrains the reliabilities to be nondecreasing and that the prior distribution for reliability at each stage is uniform. Simulation models are designed to facilitate testing for the validity and computation of the Bayesian model with ordered reliabilities as well as to compare results with other reliability growth models.