论文信息 - A Smoothing Filter for Misorientation Mapping Obtained by EBSD

A Smoothing Filter for Misorientation Mapping Obtained by EBSD

Electron backscatter diﬀraction in conjunction with scanning electron microscopy is used to assess local misorientation. However,measurementerrorscausethedistributionofmisorientationtobe scattered.Toreducetheerrorsinlocalmisorientationidentiﬁcationandobtainasmoothmap,adataprocessingprocedureisproposed.Bytakingtheaverageofthecrystalorientationofsurroundingpoints,thedistributionofthe local misorientation became smoother and clearer. Moreover, the obtained local misorientation was shown to be valid for quantitativelyevaluating the degree of plastic strain induced in Type 316 stainless steel. [doi:10.2320/matertrans.MAW201005](Received April 8, 2010; Accepted May 12, 2010; Published August 25, 2010)Keywords: electron backscatter diﬀraction, crystal orientation, misorientation, ﬁlter, plastic strain

M. Kamaya

[1] M. Kamaya. Measurement of local plastic strain distribution of stainless steel by electron backscatter diffraction , 2009 .

[2] A. Wilkinson,et al. Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction , 2006 .

[3] A. Wilkinson,et al. Measurement of plastic strain of polycrystalline material by electron backscatter diffraction , 2005 .

[4] A. Wilkinson. A new method for determining small misorientations from electron back scatter diffraction patterns , 2001 .

[5] F. J. Humphreys,et al. Orientation averaging of electron backscattered diffraction data , 2001, Journal of microscopy.

[6] D. Prior. Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM , 1999, Journal of microscopy.

[7] A. Sutton. Statistical representation and analysis of orientational data , 1996 .

[8] A. Wilkinson,et al. Quantitative deformation studies using electron back scatter patterns , 1991 .