In situ and air index measurements: influence of the deposition parameters on the shift of TiO2/SiO2 Fabry-Perot filters.
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E Pelletier | J. Borgogno | E. Pelletier | G. Albrand | J P Borgogno | G Albrand | B Schmitt | B. Schmitt
[1] H. Pulker,et al. Refractive indices of TiO(2) films produced by reactive evaporation of various titanium-oxygen phases. , 1976, Applied optics.
[2] H A Macleod,et al. Refractive index and inhomogeneity of thin films. , 1984, Applied optics.
[3] P. Roche,et al. An improved method for the determination of the extinction coefficient of thin film materials , 1983 .
[4] H. A. Macleod,et al. Moisture penetration patterns in thin films , 1976 .
[5] E Pelletier,et al. Automatic determination of the optical constants of inhomogeneous thin films. , 1982, Applied optics.
[6] E Pelletier,et al. Optical thin film monitoring—Recent advances and limitations , 1981 .
[7] H. A. Macleod,et al. Turning Value Monitoring of Narrow-band All-dielectric Thin-film Optical Filters , 1972 .