Monitoring kth order runs in binary processes

Procedures for continuously monitoring binary attribute data processes are of utmost relevance for fields like electrical engineering, chemical production, software quality engineering, healthcare monitoring, and many more. In this article, new approaches are proposed, where kth order runs in a binary process are monitored. We derive methods for evaluating the performance of the new control charts, discuss computational issues of these methods and give design recommendations for the control charts. A real-data example demonstrates the successful application of the new control procedures.

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