A FEM punch-through IGBT model using an efficient parameter extraction method

A finite element physics-based punch-through IGBT model is presented. The model's core is based on solving the ambipolar diffusion equation (ADE) trough a variational formulation, resulting in a system of ODEs. The approach enables an easy implementation into a standard circuit simulator SPICE by means of an electrical analogy with the resulting system of ODEs, solved as a set of current controlled RC nets that describes charge carrier distribution in low-doped zone. The issue of parameter extraction for physics-based IGBT models is also addressed. An optimisation-based algorithm enabling an efficient parameter extraction method for IGBT model is discussed. Model is validated comparing experimental and simulated results

[1]  Oscar Apeldoorn,et al.  Design, test and characteristics of 10 kV IGCTs , 2003, 38th IAS Annual Meeting on Conference Record of the Industry Applications Conference, 2003..

[2]  A. Araújo Modelação de semicondutores bipolares : formulação de um novo método para simulação em circuitos electrónicos de potência , 1998 .

[3]  T. Laska The Field Stop IGBT (FS IGBT) A new device concept with a great improvement Potential , 2006 .

[4]  R. Kraus,et al.  Parameter extraction methodology and validation for an electro-thermal physics-based NPT IGBT model , 1997, IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting.

[5]  T. Laska,et al.  The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential , 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

[6]  E. Santi,et al.  Physical modeling of IGBT turn on behavior , 2003, 38th IAS Annual Meeting on Conference Record of the Industry Applications Conference, 2003..

[7]  Jerry L. Hudgins,et al.  The use of a formal optimisation procedure in automatic parameter extraction of power semiconductor devices , 2003, IEEE 34th Annual Conference on Power Electronics Specialist, 2003. PESC '03..

[8]  C. S. Mitter,et al.  Insulated gate bipolar transistor (IGBT) modeling using IG-SPICE , 1991, Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting.

[9]  Adriano Carvalho,et al.  SPICE Implementation of a Finite Element Method Based Model for Bipolar Power Semiconductors , 2003 .

[10]  M. Cotorogea,et al.  Parameter extraction for physics-based IGBT models by electrical measurements , 2002, 2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289).

[11]  A. Hefner,et al.  Automated parameter extraction software for advanced IGBT modeling , 2000, COMPEL 2000. 7th Workshop on Computers in Power Electronics. Proceedings (Cat. No.00TH8535).

[12]  Adriano Carvalho,et al.  A New Physics Based SPICE Sub-circuit Model for Insulated Gate Bipolar Transistors (IGBTs) , 2003 .

[13]  R. Chibante,et al.  A new physics based SPICE model for NPT IGBTs , 2003, IECON'03. 29th Annual Conference of the IEEE Industrial Electronics Society (IEEE Cat. No.03CH37468).

[14]  Hans Jurgen Mattausch,et al.  Status and trends of power semiconductor device models for circuit simulation , 1998 .

[15]  P. A. Mawby,et al.  Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model , 2002, Microelectron. Reliab..

[16]  K. Satoh,et al.  Characteristics of a 1200 V CSTBT optimized for industrial applications , 2001, Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248).

[18]  E. Santi,et al.  Parameter extraction for a physics-based circuit simulator IGBT model , 2003, Eighteenth Annual IEEE Applied Power Electronics Conference and Exposition, 2003. APEC '03..

[19]  Adriano Carvalho,et al.  A simple and efficient parameter extraction procedure for physics based IGBT models , 2004 .

[20]  Francesco Iannuzzo,et al.  Lumped charge PSPICE model for high-voltage IGBTs , 2000, Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129).

[21]  Jerry L. Hudgins,et al.  Circuit simulator models for the diode and IGBT with full temperature dependent features , 2001, 2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. No.01CH37230).