The extension of the NIST BRDF scale from 1100 nm to 2500 nm
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[1] Howard W. Yoon,et al. Performance comparisons of InGaAs, extended InGaAs, and short-wave HgCdTe detectors between 1 μm and 2.5 μm , 2006, SPIE Optics + Photonics.
[2] James J. Butler,et al. The effect of incident light polarization on spectralon BRDF measurements , 2004, SPIE Remote Sensing.
[3] Jack J. Hsia,et al. NBS Measurement Services: Spectral Reflectance , 1987 .
[4] A. Höpe,et al. Comparison measurements of 0:45 radiance factor and goniometrically determined diffuse reflectance. , 2009, Applied optics.
[5] Robert A. Barnes,et al. The reflectance-based calibration of SeaWiFS , 2003, SPIE Remote Sensing.
[6] A. Höpe,et al. New robot-based gonioreflectometer for measuring spectral diffuse reflection , 2006 .
[7] J. Irons,et al. Requirements for a Landsat Data Continuity Mission , 2006 .
[8] David C. Williams. Establishment of absolute diffuse reflectance scales using the NPL Reference Reflectometer , 1999 .
[9] Erkki Ikonen,et al. Gonioreflectometer for measuring spectral diffuse reflectance. , 2004, Applied optics.
[10] Maria E. Nadal,et al. Near Infrared 45°/0° Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder , 1999, Journal of Research of the National Institute of Standards and Technology.
[11] Robert A Barnes,et al. Reflectance-based calibration of SeaWiFS. I. Calibration coefficients. , 2003, Applied optics.
[12] W. Mccluney. Introduction to Radiometry and Photometry , 1994 .