论文信息 - On-The-Fly Interface Trap Measurement and Its Impact on the Understanding of NBTI Mechanism for p-MOSFETs with SiON Gate Dielectric - 字舞流文

On-The-Fly Interface Trap Measurement and Its Impact on the Understanding of NBTI Mechanism for p-MOSFETs with SiON Gate Dielectric

Ming-Fu Li | C. Shen | W.J. Liu | Z.Y. Liu | Darning Huang | C. Liao | L. Zhang | Z. Gan | W. Wong