A Research of Defect Detection using The Mahalanobis-Taguchi System Method

In this case, a new approach for appearance defect inspection using Mahalanobis-Taguchi System was applied. Images from a group of "good" (normal) products were transformed into wave patterns. From these normal patterns, "differential characteristic" and "integral characteristic" data were picked up. A Mahalanobis space was constructed using these data. Then, the image of a product to be inspected was transformed into a group of wave patterns, and the differential and integral characteristics were picked up from the patterns. The data from these characteristics were calculated with the said Mahalanobis