14.5% near-normal incidence reflectance of Cr/Sc x-ray multilayer mirrors for the water window.
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Fredrik Eriksson | Jens Birch | Hans M Hertz | E. Gullikson | H. Hertz | F. Eriksson | G. Johansson | J. Birch | U. Kreissig | Ulrich Kreissig | Eric M Gullikson | Göran A Johansson
[1] M. Berglund,et al. Compact soft x-ray reflectometer based on a line-emitting laser-plasma source , 2001 .
[2] Torsten Feigl,et al. Chromium-scandium multilayer mirrors for the nitrogen K(alpha) line in the water window region. , 2002, Applied optics.
[3] E. A. Shamov,et al. Multilayer dispersion optics for X-ray radiation , 2000 .
[4] Eric M. Gullikson,et al. Calibration and standards beamline 6.3.2 at the Advanced Light Source , 1996 .
[5] H. Hertz,et al. Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition , 2002 .
[6] T. Wilhein,et al. Compact water‐window transmission X‐ray microscopy , 2000, Journal of microscopy.
[7] Franz Schäfers,et al. Cr/Sc nanolayers for the water window: improved performance , 2001 .
[8] Hans M. Hertz,et al. Design and performance of a laser-plasma-based compact soft x-ray microscope , 2002 .
[9] Masaki Yamamoto,et al. Development of soft x-ray multilayer mirrors for a wavelength of 3 nm , 1999, Optics & Photonics.
[10] Kirill A. Prokhorov,et al. Short-period X-ray multilayers based on Cr/Sc, W/Sc , 1998 .
[11] U. Heinzmann,et al. Time-resolved atomic inner-shell spectroscopy , 2002, Nature.
[12] Hans M. Hertz,et al. Normal-incidence condenser mirror arrangement for compact water-window x-ray microscopy , 1999, Optics & Photonics.
[13] F. Schäfers. Multilayers for the EUV/soft X-ray range , 2000 .
[14] E. Gullikson,et al. Soft X-ray reflectivity and structure evaluation of Ni/C/Ti/C multilayer X-ray mirrors for water-window region , 2001 .
[15] H. Krebs,et al. Alloy-ceramic oxide multilayer mirrors for water-window soft x rays. , 2001, Optics letters.
[16] N N Salashchenko,et al. Cr /sc multilayers for the soft-x-ray range. , 1998, Applied optics.
[17] R. Stuik,et al. Progress in Mo/Si multilayer coating technology for EUVL optics , 2000, Advanced Lithography.
[18] B. L. Henke,et al. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 , 1993 .
[19] David L. Windt,et al. IMD—software for modeling the optical properties of multilayer films , 1998 .
[20] David L. Windt,et al. Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics , 2003, SPIE Astronomical Telescopes + Instrumentation.
[21] Roman Tatchyn,et al. Radiation properties of the Linac Coherent Light Source: challenges for x-ray optics , 2001, SPIE Optics + Photonics.
[22] C. Charton,et al. Growth of Ag films on PET deposited by magnetron sputtering , 2002 .