论文信息 - Testability design of multi-valued RTD circuits

Testability design of multi-valued RTD circuits

Purpose of the paper is to analyze the physical faults and propose a testability design method for multi-valued RTD circuits based on the stuck faults analysis and stuck faults model, which takes ternary RTD (Resonant Tunneling Diode) quantizer as an example. The test model has a high testability level and low hardware cost which consists of an extra tri-valued inverter circuit and two control ports. By setting different input and testing signals, it generates different testing vectors, which can detect all open circuit faults and short circuit faults.

Lin Mi | Zhang Haipeng | Sun Lingling

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