The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons
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Hooshang Nikjoo | Reza Taleei | K. Sankaranarayanan | H. Nikjoo | Peter M Girard | Krishnaswami Sankaranarayanan | R. Taleei | P. Girard
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