Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction
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Y. Qiu | H. Yang | Xiahe Huang | Jin-yun Wang | Jianli Liu | Xiangyu Guo | K.-M. Huang | Y. Zhang | Xiaojian Hu | Yujin Xu | K. Xu | Y. Xu | X. Hu | X. Guo | J. Wang | Y. Qiu | K. Huang | J. Liu | X. H. Huang