High-performance facility and techniques for high-precision machining of optical components by ion beams
暂无分享,去创建一个
N. I. Chkhalo | A. E. Pestov | N. N. Salashchenko | M. S. Mikhaylenko | Vladimir N. Polkovnikov | I. G. Zabrodin | M. N. Toropov | I. V. Malyshev | I. A. Kas’kov
[1] N. Salashchenko,et al. Resolving capacity of the circular Zernike polynomials. , 2015, Optics express.
[2] Xuhui Xie,et al. Figuring algorithm for high-gradient mirrors with axis-symmetrical removal function. , 2010, Applied optics.
[3] N. Chkhalo,et al. Evolution of the roughness of amorphous quartz surfaces and Cr/Sc multilayer structures upon exposure to ion-beam etching , 2011 .
[4] Craig Hoffman,et al. Optics research at the U.S. Naval Research Laboratory. , 2015, Applied optics.
[5] S. R. Wilson,et al. Surface Figuring Using Neutral Ion Beams , 1989, Optics & Photonics.
[6] N. I. Chkhalo,et al. Manufacturing of XEUV mirrors with a sub-nanometer surface shape accuracy , 2009 .
[7] Xuhui Xie,et al. Mathematical modeling and application of removal functions during deterministic ion beam figuring of optical surfaces. Part 2: application. , 2014, Applied optics.
[8] N. Salashchenko,et al. Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet optics. , 2016, Applied optics.
[9] M. N. Toropov,et al. Principles of certification of aspherical mirrors for an EUV lithography lens at a wavelength of 13.5 nm , 2015, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.
[10] N. Chkhalo,et al. Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics. , 2014, Optics express.
[11] F. Bijkerk,et al. Roughness evolution of Si surfaces upon Ar ion erosion , 2010 .
[12] M V Svechnikov,et al. Application of point diffraction interferometry for middle spatial frequency roughness detection. , 2015, Optics letters.
[13] I. L. Strulya,et al. Polished sitall substrates for X-ray optics , 2013, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.
[14] I. L. Strulya,et al. Reflective Schmidt-Cassegrain system for large-aperture telescopes. , 2016, Applied optics.
[15] Olaf Schmelzer,et al. Precision machining of optical surfaces with subaperture correction technologies MRF and IBF , 2015, SPIE Optifab.
[16] Lynn N. Allen,et al. Demonstration of an ion-figuring process , 1990, Optics & Photonics.
[17] D. E. Pariev,et al. Advanced materials for multilayer mirrors for extreme ultraviolet solar astronomy. , 2016, Applied optics.
[18] M. N. Toropov,et al. Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands , 2012 .
[19] Eric M. Gullikson,et al. Multilayers for next generation EUVL at 6.X nm , 2011, Optics + Optoelectronics.
[20] N. I. Chkhalo,et al. Particulars of studying the roughness of substrates for multilayer X-ray optics using small-angle X-ray reflectometry, atomic-force, and interference microscopy , 2011 .
[21] Martin Weiser,et al. Ion beam figuring for lithography optics , 2009 .
[22] Xuhui Xie,et al. Structure optimization and fabricating capability analysis of an ion-beam machine for a subnanometer optical surface. , 2015, Applied optics.
[23] A. Keller,et al. The morphology of amorphous SiO2 surfaces during low energy ion sputtering , 2009, Journal of physics. Condensed matter : an Institute of Physics journal.
[24] Sven Kiontke,et al. Ion Beam Figuring Technology in Optics Manufacturing , 2012 .
[25] N. Salashchenko,et al. Note: A stand on the basis of atomic force microscope to study substrates for imaging optics. , 2015, The Review of scientific instruments.
[26] Hiroyuki Kondo,et al. Development status of projection optics and illumination optics for EUV1 , 2008, SPIE Advanced Lithography.
[27] M. N. Toropov,et al. A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit aperture. , 2008, The Review of scientific instruments.
[28] Xuhui Xie,et al. Morphology evolution of fused silica surface during ion beam figuring of high-slope optical components. , 2013, Applied optics.
[29] J. Broder,et al. Aspheric Generation On Glass By Ion Beam Milling , 1989, Other Conferences.
[30] N. I. Chkhalo,et al. A stand for a projection EUV nanolithographer-multiplicator with a design resolution of 30 nm , 2011 .
[31] N. I. Chkhalo,et al. The evolution of roughness of supersmooth surfaces by ion-beam etching , 2012 .
[32] M. N. Toropov,et al. Problems in the application of a null lens for precise measurements of aspheric mirrors. , 2016, Applied optics.
[33] G. Boehm,et al. Ion beam and plasma jet based methods in ultra-precision optics manufacturing , 2015, Other Conferences.
[34] Xuhui Xie,et al. Mathematical modeling and application of removal functions during deterministic ion beam figuring of optical surfaces. Part 1: Mathematical modeling. , 2014, Applied optics.
[35] N. Salashchenko,et al. Sub-micrometer resolution proximity X-ray microscope with digital image registration. , 2015, The Review of scientific instruments.
[36] Georg Böhm,et al. Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook , 2010 .
[37] Lin Zhou,et al. A one-dimensional ion beam figuring system for x-ray mirror fabrication. , 2015, The Review of scientific instruments.
[38] C. Wagner,et al. EUV lithography: Lithography gets extreme , 2010 .