Erik H. Hároz,1,2 Juan G. Duque,3 Eduardo B. Barros,4 Hagen Telg,1 Jeffrey R. Simpson,5,6 Angela R. Hight Walker,6 Constantine Y. Khripin,7 Jeffrey A. Fagan,7 Xiaomin Tu,7 Ming Zheng,7 Junichiro Kono,2 and Stephen K. Doorn1,* 1Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA 2Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA 3Chemistry Division, Physical Chemistry and Applied Spectroscopy (C-PCS), Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA 4Departamento de Fı́sica, Universidade Federal do Ceará, Fortaleza-Ceará, Brasil 5Department of Physics, Astronomy, and Geosciences, Towson University, Towson, Maryland 21252, USA 6Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA 7Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA (Received 27 February 2013; revised manuscript received 2 April 2015; published 29 May 2015)