论文信息 - PROBLEM OF PHASE RETRIEVAL IN LIGHT AND ELECTRON-MICROSCOPY OF STRONG OBJECTS .2. UNIQUENESS AND STABILITY OF OBJECT RECONSTRUCTION PROCEDURES USING 2 DEFOCUSED IMAGES

PROBLEM OF PHASE RETRIEVAL IN LIGHT AND ELECTRON-MICROSCOPY OF STRONG OBJECTS .2. UNIQUENESS AND STABILITY OF OBJECT RECONSTRUCTION PROCEDURES USING 2 DEFOCUSED IMAGES

In this paper we prove the validity of numerical methods, designed to retrieve the phase of the wave function in some plane in a light or electron microscope, that use the intensity distributions in the image plane at two different settings of the defocus. The main condition we have to impose on the solutions is that it is differentiable almost everywhere. This condition is usually satisfied by numerical solutions, as they are an interpolation of a finite number of function values. The method we use to show the uniqueness is also well suited to studying the influence of all kinds of errors. A rough estimate of their influence will be given. In the next papers of this series a fast computation method to perform the phase retrieval will be introduced and demonstrated.

H. A. Ferwerda | A.M.J. Huiser | A. Huiser | H. Ferwerda

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