Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films
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F. G. L. Parlane | Qianxiao Li | Felipe Oviedo | Zhe Liu | T. Buonassisi | J. Senthilnath | Zekun Ren | S. Tian | A. Aberle | Senthilnath Jayavelu | S. Venkataraj | Vijila Chellappan | C. Berlinguette | Daniil Bash | Y. Lim | B. MacLeod | F. G. Parlane | Y. Cheng