Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness.
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Masato Ohmi | Masamitsu Haruna | Hideki Maruyama | M. Ohmi | M. Haruna | H. Maruyama | S. Inoue | T. Mitsuyama | Teruki Mitsuyama | Shogo Inoue | Teruki Mitsuyama
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