Silicon debug: avoid needles respins
暂无分享,去创建一个
[1] Derek Feltham,et al. Pentium(R) Pro processor design for test and debug , 1997, Proceedings International Test Conference 1997.
[2] Sandeep Kumar Goel,et al. Design for debug: catching design errors in digital chips , 2002, IEEE Design & Test of Computers.
[3] Alfred L. Crouch,et al. Testability features of the MC68060 microprocessor , 1994, Proceedings., International Test Conference.
[4] Santanu Dutta,et al. Viper: A Multiprocessor SOC for Advanced Set-Top Box and Digital TV Systems , 2001, IEEE Des. Test Comput..
[5] Sridhar Narayanan,et al. Testability, debuggability, and manufacturability features of the UltraSPARC-I microprocessor , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[6] Hong Hao,et al. Clock controller design in SuperSPARC II microprocessor , 1995, Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors.
[7] Sandeep Kumar Goel,et al. Automatic generation of breakpoint hardware for silicon debug , 2004, Proceedings. 41st Design Automation Conference, 2004..
[8] Bart Vermeulen,et al. Test and debug strategy of the PNX8525 Nexperia/sup TM/ digital video platform system chip , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).
[9] Derek Feltham,et al. Pentium Pro Processor Design for Test and Debug , 1998, IEEE Des. Test Comput..
[10] Don Douglas Josephson,et al. Debug methodology for the McKinley processor , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).
[11] B. Vermeulen,et al. Core-based scan architecture for silicon debug , 2002, Proceedings. International Test Conference.