Power MOSFET failure revisited

The failure of power MOSFETs during avalanche breakdown is discussed. A theory is presented that relates the failure to the temperature rise of the chip during the avalanche breakdown and to a critical current for failure. It is shown that the energy that can be safely dissipated during avalanche breakdown decreases as the starting current increases or as the case temperature increases. Thus, if power MOSFETs are to be rated for their energy dissipation capability during avalanche breakdown, both the starting current and temperature must be specified, since it is these two parameters that determine the failure limits, and not the energy.<<ETX>>

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