Scattering from moderately rough interfaces between two arbitrary media

The generalized Harvey-Shack (GHS) surface scatter theory has been shown to accurately predict the BRDF produced by moderately rough mirror surfaces from surface metrology data. The predicted BRDF also holds for both large incident and scattering angles. Furthermore, it provides good agreement with the classical Rayleigh-Rice theory for those surfaces that satisfy the smooth-surface criterion. The two-dimensional band-limited portion of the surface PSD contributing to scattered radiation is discussed and illustrated for arbitrary incident angles, and the corresponding relevant roughness necessary to calculate the total integrated scatter (TIS) is determined. It is shown that BRDF data measured with a large incident angle can be used to expand the range of surface roughness for which the inverse scattering problem can be solved; i.e., for which the surface PSD can be calculated from measured BRDF data. This PSD and the GHS surface scatter theory can then be used to calculate the BRDF of that surface for arbitrary incident angles and wavelengths that do not satisfy the smooth-surface criterion. Finally, the surface transfer function characterizing both the BTDF and the BRDF of a moderately rough interface separating two media of arbitrary refractive index is derived in preparation for modeling the scattering of structured thin film solar cells.

[1]  P. Beckmann,et al.  The scattering of electromagnetic waves from rough surfaces , 1963 .

[2]  A. Duparré,et al.  Angle-resolved scattering: an effective method for characterizing thin-film coatings. , 2011, Applied optics.

[3]  Jack D. Gaskill,et al.  Linear systems, fourier transforms, and optics , 1978, Wiley series in pure and applied optics.

[4]  Andrey Krywonos,et al.  Predicting surface scatter using a linear systems formulation of non-paraxial scalar diffraction , 2006 .

[5]  J. E. Harvey,et al.  Description of Diffraction Grating Behavior in Direction Cosine Space , 1998 .

[6]  J A Ratcliffe,et al.  Investigation of molecular motions in supercooled liquids by Mossbauer scattering D C Champeney and F W D Woodhams Some Aspects of Diffraction Theory and their Application to the Ionosphere , 1956 .

[7]  W. Marsden.  I and J , 2012 .

[8]  S. Rice.  Reflection of electromagnetic waves from slightly rough surfaces , 1951 .

[9]  G. G. Stokes.  "J." , 1890, The New Yale Book of Quotations.

[10]  Patrick L. Thompson,et al.  Diffracted radiance: a fundamental quantity in nonparaxial scalar diffraction theory. , 1999 .

[11]  James E. Harvey.  Surface Scatter Phenomena: A Linear, Shift-Invariant Process , 1990, Optics & Photonics.

[12]  James E. Harvey,et al.  Light-Scattering Characteristics Of Optical Surfaces , 1977, Other Conferences.

[13]  Michael G. Dittman,et al.  K-correlation power spectral density and surface scatter model , 2006, SPIE Optics + Photonics.

[14]  Peter Z. Takacs,et al.  Light scattering from non-Gaussian surfaces , 1995, Optics & Photonics.

[15]  C. Battaglia,et al.  Modeling of light scattering from micro- and nanotextured surfaces , 2010 .

[16]  John C. Stover,et al.  Unified scatter model for rough surfaces at large incident and scatter angles , 2007, SPIE Optical Engineering + Applications.

[17]  A. Duparré,et al.  Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components. , 2002, Applied optics.

[18]  Andrey Krywonos,et al.  Nonparaxial scalar treatment of sinusoidal phase gratings. , 2006, Journal of the Optical Society of America. A, Optics, image science, and vision.

[19]  J. Stover.  Optical Scattering: Measurement and Analysis , 1990 .

[20]  F. E. Nicodemus.  Reflectance nomenclature and directional reflectance and emissivity. , 1970, Applied optics.

[21]  Arvind Shah,et al.  Light Trapping Enhancement for Thin-Film Silicon Solar Cells by Roughness Improvement of the ZnO Front TCO , 2000 .

[22]  James E. Harvey,et al.  Calculating BRDFs from surface PSDs for moderately rough optical surfaces , 2009, Optical Engineering + Applications.

[23]  Andreas Tünnermann,et al.  Scattering of Roughened TCO Films – Modeling and Measurement , 2010 .