High‐Speed Photographic Study of Wave Propagation and Impact Damage in Fused Silica and AlON Using the Edge‐On Impact (EOI) Method
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James W. McCauley | Parimal J. Patel | D. W. Templeton | Elmar Strassburger | J. Mccauley | P. Patel | E. Strassburger | D. Templeton | J. McCauley
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