Frequency Modulation Atomic Force Microscopy in Liquids

Atomic force microscopy (AFM) using frequency modulation (FM) detection has been widely used for the atomic-scale investigations of various materials. However, high-resolution imaging in liquids by FM-AFM is severely deteriorated by the extreme reduction of the Q-factor due to the hydrodynamic interaction between the cantilever and the liquid. Recently, the use of the small amplitude mode and the large noise reduction in the cantilever deflection sensor brought great progress in FM-AFM imaging in liquids. In this chapter viscous damping of the cantilever and the electric double layer force are discussed in detail. Following the detailed analysis of the frequency noise in FM-AFM, instrumentation of the optical beam deflection sensor for FM-AFM in liquid environments is described. Finally high-resolution FM-AFM images of muscovite mica, purple membranes, and isolated protein molecules in liquids are presented.

[1]  E. Wolf,et al.  Principles of Optics (7th Ed) , 1999 .

[2]  K. Matsushige,et al.  Surface potential measurements of phase-separated alkanethiol self-assembled monolayers by non-contact atomic force microscopy , 2004 .

[3]  Kei Kobayashi,et al.  Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy , 2005 .

[4]  J. Sader.  Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope , 1998 .

[5]  W. P. Robins,et al.  Phase Noise in Signal Sources , 1984 .

[6]  Cees Otto,et al.  Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation , 2004 .

[7]  D. Rugar,et al.  Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity , 1991 .

[8]  Kei Kobayashi,et al.  True atomic resolution in liquid by frequency-modulation atomic force microscopy , 2005 .

[9]  Franz J. Giessibl,et al.  Forces and frequency shifts in atomic-resolution dynamic-force microscopy , 1997 .

[10]  N. Amer,et al.  Optical‐beam‐deflection atomic force microscopy: The NaCl (001) surface , 1990 .

[11]  Masayuki Abe,et al.  Atom inlays performed at room temperature using atomic force microscopy , 2005, Nature materials.

[12]  Suresh V. Garimella,et al.  Hydrodynamic loading of microcantilevers vibrating in viscous fluids , 2006 .

[13]  John E. Sader,et al.  Frequency response of cantilever beams immersed in viscous fluids near a solid surface with applications to the atomic force microscope , 2005 .

[14]  M. Lantz,et al.  Dynamic force microscopy in fluid , 1999 .

[15]  J. Israelachvili.  Intermolecular and surface forces , 1985 .

[16]  P. Saulson,et al.  Thermal noise in mechanical experiments. , 1990, Physical review. D, Particles and fields.

[17]  K. Matsushige,et al.  True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments , 2005 .

[18]  A. Maali,et al.  Hydrodynamics of oscillating atomic force microscopy cantilevers in viscous fluids , 2005 .

[19]  N. Chinone,et al.  Diode laser noise at video frequencies in optical videodisc players. , 1984, Applied optics.

[20]  M. Lagally,et al.  Imaging of all dangling bonds and their potential on the Ge/Si105 surface by noncontact atomic force microscopy. , 2004, Physical review letters.

[21]  N. Amer,et al.  Novel optical approach to atomic force microscopy , 1988 .