A New Performance Characterization of Transient Analysis Method

This paper proposes a new performance characterization for the test strategy intended for second order filters denominated Transient Analysis Method (TRAM). We evaluate the ability of the addressed test strategy for detecting deviation faults under simultaneous statistical fluctuation of the non-faulty parameters. For this purpose, we use Monte Carlo simulations and a fault model that considers as faulty only one component of the filter under test while the others components adopt random values (within their tolerance band) obtained from their statistical distributions. The new data reported here show (for the filters under study) the presence of hard-to-test components and relatively low fault coverage values for small deviation faults. These results suggest that the fault coverage value obtained using only nominal values for the non-faulty components (the traditional evaluation of TRAM) seem to be a poor predictor of the test performance. Keywords—testing, fault analysis, analog filter test, parametric faults detection.

[1]  Marcelo Lubaszewski,et al.  Fault detection methodology and BIST method for 2nd order Butterworth, Chebyshev and Bessel filter approximations , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[2]  Pascal Nouet,et al.  Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy , 2008 .

[3]  Bozena Kaminska,et al.  Parametric fault simulation and test vector generation , 2000, DATE '00.

[4]  José Luis Huertas,et al.  Analog and mixed-signal benchmark circuits-first release , 1997, Proceedings International Test Conference 1997.

[5]  Stephen K. Sunter,et al.  Test metrics for analog parametric faults , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

[6]  Mark Zwolinski,et al.  Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations , 2004, J. Electron. Test..

[7]  Pascal Nouet,et al.  Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults , 2003 .

[8]  Abhijit Chatterjee,et al.  Quasi-oscillation based test for improved prediction of analog performance parameters , 2004 .

[9]  Abdelhakim Khouas,et al.  Fault Simulation for Analog Circuits Under Parameter Variations , 2000, J. Electron. Test..

[10]  Zhen Guo,et al.  Test limitations of parametric faults in analog circuits , 2003, IEEE Trans. Instrum. Meas..

[11]  M. Lubaszewski,et al.  Fault detection methodology for second order filters using compact test vectors transient analysis , 1999, Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303).

[12]  Fang Liu,et al.  Statistical Test Development for Analog Circuits Under High Process Variations , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[13]  Salvador Mir,et al.  Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing , 2007, J. Electron. Test..

[14]  Soon-Jyh Chang,et al.  Structural Fault Based Specification Reduction for Testing Analog Circuits , 2002, J. Electron. Test..