Most existing digital fault simulators can simulate only a somewhat restrictive class of failures; namely, stuck at “1” and stuck at “0” faults. The problem seems to be the lack of techniques for properly treating the effects due to “backward propagation” of errors. This paper describes a method for illustrating how shorted input diode failures, which previously could not be simulated, can be handled by digital methods. The method is applicable to all other modes of failures describable by truth tables or Boolean expressions. Furthermore, we examine the problem of circuit oscillations caused by backward propagating errors. We conclude that failure induced oscillations can only occur under very restrictive conditions.
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