论文信息 - Experimental and Numerical Analysis of Hole Emission Process From Carbon-Related Traps in GaN Buffer Layers - 字舞流文

Experimental and Numerical Analysis of Hole Emission Process From Carbon-Related Traps in GaN Buffer Layers

G. Verzellesi | F. Fantini | M. Meneghini | G. Meneghesso | A. Chini | F. Iucolano | A. Patti