Partially Coherent Spectral Transmittance of Dielectric Thin Films with Rough Surfaces

The effects of scattering and partial coherence on the transmittance of thin films with rough surfaces are investigated. For the rough side, the rms roughness is between 0.3 and 0.7 µm, whereas the autocorrelation length ranges from 1 to 36 µm. Scalar scattering theory (SST) is used to account for the scattering losses in the specular direction due to surface roughness, and then the calculated transmittance is spectrally averaged over the coherence spectral width. The spectral averaging method takes into consideration the effect of partial coherence. A Fouriertransform infrared spectrometer measures the near-normal transmittance in the midinfrared region from 2- to 20-µ mw avelengths. Comparison of the calculated transmittance with that of the measured transmittance shows that the combination of SST with spectral averaging can correctly predict the measured fringe contrast and fringe flipping, whereas SST alone does not result in quantitative agreement with the experiments. A coherence function is introduced to characterize the degree of coherence as a function of wave number for samples with or without ar ough surface. Furthermore, it is shown that SST is not applicable to surfaces whose autocorrelation length is greater than the wavelength of the incident radiation. Nomenclature d = thickness, m i = √ −1 k = imaginary part of the complex refractive index n = real part of the complex refractive index R = reflectance r = Fresnel reflection coefficient S = scattering factor T = transmittance ¯ T = spectrally averaged transmittance t = Fresnel transmission coefficient β = phase shift, rad �ν = free spectral range, m −1 δν = coherence spectral width, m −1 θ = polar angle, rad λ =w avelength of the incident radiation in vacuum, m ν =w ave number, m −1 σ = rms roughness, m τ = internal transmissivity � = fringe contrast φ = coherence function Subscripts coh = coherent p = p polarization r = reflection s = s polarization t = transmission

[1]  P. Griffiths Fourier Transform Infrared Spectrometry , 2007 .

[2]  Partial coherence theory of multilayer thin-film optical properties , 1993 .

[3]  Miloslav Ohlídal,et al.  IV: Scattering of Light from Multilayer Systems With Rough Boundaries , 1995 .

[4]  Lawrence H. Robins,et al.  Determination of the optical constants of thin chemical-vapor-deposited diamond windows from 0.5 to 6.5 eV , 1991, Optics & Photonics.

[5]  H. E. Bennett,et al.  Relation between Surface Roughness and Specular Reflectance at Normal Incidence , 1961 .

[6]  P. Beckmann,et al.  The scattering of electromagnetic waves from rough surfaces , 1963 .

[7]  A. Fejfar,et al.  Optical absorption and light scattering in microcrystalline silicon thin films and solar cells , 2000 .

[8]  Narendra J. Sheth,et al.  Statistical Design and Analysis of Engineering Experiments , 1973 .

[9]  L. Trefethen,et al.  Cross correlation of optical properties of thin films under thermal radiation , 1992 .

[10]  D. Edwards,et al.  Cubic Carbon (Diamond) , 1997 .

[11]  Zhuomin M. Zhang,et al.  OPTICAL AND THERMAL RADIATIVE PROPERTIES OF SEMICONDUCTORS RELATED TO MICRO/NANOTECHNOLOGY , 2003 .

[12]  C. K. Carniglia,et al.  Scalar Scattering Theory for Multilayer Optical Coatings , 1979 .

[13]  O. Stenzel,et al.  Modeling of transmittance, reflectance and scattering of rough polycrystalline CVD diamond layers in application to the determination of optical constants , 1994 .

[14]  C. Tien,et al.  Partial Coherence Theory of Thin Film Radiative Properties , 1992 .

[15]  D. Siapkas,et al.  Generalized matrix method for analysis of coherent and incoherent reflectance and transmittance of multilayer structures with rough surfaces, interfaces, and finite substrates. , 1995, Applied optics.

[16]  H. Davies The reflection of electromagnetic waves from a rough surface , 1954 .

[17]  Radiative properties of films using partial coherence theory , 1996 .

[18]  Z. M. Zhang Optical properties of a slightly absorbing film for oblique incidence. , 1999, Applied optics.

[19]  I. Filiński,et al.  The effects of sample imperfections on optical spectra , 1972 .

[20]  M. Montecchi,et al.  Reflectance and transmittance of a slightly inhomogeneous thin film bounded by rough, unparallel interfaces , 2001 .

[21]  Yu-Bin Chen,et al.  Microscale radiation in thermophotovoltaic devices—A review , 2007 .

[22]  Hyunjin Lee,et al.  Applicability of Phase Ray-Tracing Method for Light Scattering from Rough Surfaces , 2006 .

[23]  R. A. Dimenna,et al.  Regions of validity of the geometric optics approximation for angular scattering from very rough surfaces , 1996 .

[24]  D. G. McDonald,et al.  Partially Coherent Transmittance of Dielectric Lamellae , 1995 .