Insights into interface and bulk defects in a high efficiency kesterite-based device
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M. Placidi | A. Pérez‐Rodríguez | L. Calvo‐Barrio | R. Fonoll‐Rubio | V. Izquierdo‐Roca | E. Saucedo | S. Estradé | F. Peiró | M. Ritzer | I. Becerril‐Romero | M. Guc | C. Schnohr | J. Andrade-Arvizu | J. Blanco-Portals