4H-SiC Power Metal–Oxide–Semiconductor Field Effect Transistors and Schottky Barrier Diodes of 1.7 kV Rating
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Y. Nakao | T. Oomori | M. Imaizumi | N. Miura | H. Sumitani | H. Yamamoto | K. Kuroda | Shohei Yoshida | Y. Matsuno | S. Watanabe