Excellent 22FDX Hot-Carrier Reliability for PA Applications
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S. N. Ong | S. Embabi | J. Bordelon | M. Mantravadi | W. Arfaoui | G. Bossu | M. Siddabathula | R. Taylor | T. Chen | Chi Zhang | Abdellatif Bellaouar | Kok Wai Johnny Chew | K. Barnett | S. Janardhanan