Carrier capture and escape times in In0.35Ga0.65As-GaAs multiquantum-well lasers determined from high-frequency electrical impedance measurements
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I. Esquivias | S. Weisser | J. Rosenzweig | S. Weisser | I. Esquivias | J. Rosenzweig | B. Romero | D. Ralston | B. Romero | D. Ralston
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