Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study

We present the first experimental results to establish that a binning strategy based on defect clustering can be used to screen bare die for early life failures. The data for this study comes from the SEMATECH test methods experiment.

[1]  Vishwani D. Agrawal,et al.  Characterizing the LSI Yield Equation from Wafer Test Data , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[2]  Brown,et al.  Defect Level as a Function of Fault Coverage , 1981, IEEE Transactions on Computers.

[3]  C. Stapper Correlation analysis of particle clusters on integrated circuit wafers , 1987 .

[4]  Adit D. Singh,et al.  On optimizing VLSI testing for product quality using die-yield prediction , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[5]  Adit D. Singh,et al.  Binning for IC quality: experimental studies on the SEMATECH data , 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

[6]  Adit D. Singh,et al.  On the Effect of Defect Clustering on Test Transparency and IC Test Optimization , 1996, IEEE Trans. Computers.

[7]  Adit D. Singh,et al.  On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction , 1991, 1991, Proceedings. International Test Conference.

[8]  Edward J. McCluskey,et al.  IC quality and test transparency , 1989 .

[9]  P. Nigh,et al.  An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing , 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

[10]  Adit D. Singh,et al.  Screening for known good die (KGD) based on defect clustering: an experimental study , 1997, Proceedings International Test Conference 1997.

[11]  Adit D. Singh,et al.  Chip test optimization using defect clustering information , 1992, [1992] Digest of Papers. FTCS-22: The Twenty-Second International Symposium on Fault-Tolerant Computing.

[12]  Edward J. McCluskey,et al.  IC qualityd and test transparency , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.