Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study
暂无分享,去创建一个
[1] Vishwani D. Agrawal,et al. Characterizing the LSI Yield Equation from Wafer Test Data , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[2] Brown,et al. Defect Level as a Function of Fault Coverage , 1981, IEEE Transactions on Computers.
[3] C. Stapper. Correlation analysis of particle clusters on integrated circuit wafers , 1987 .
[4] Adit D. Singh,et al. On optimizing VLSI testing for product quality using die-yield prediction , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[5] Adit D. Singh,et al. Binning for IC quality: experimental studies on the SEMATECH data , 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).
[6] Adit D. Singh,et al. On the Effect of Defect Clustering on Test Transparency and IC Test Optimization , 1996, IEEE Trans. Computers.
[7] Adit D. Singh,et al. On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction , 1991, 1991, Proceedings. International Test Conference.
[8] Edward J. McCluskey,et al. IC quality and test transparency , 1989 .
[9] P. Nigh,et al. An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing , 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).
[10] Adit D. Singh,et al. Screening for known good die (KGD) based on defect clustering: an experimental study , 1997, Proceedings International Test Conference 1997.
[11] Adit D. Singh,et al. Chip test optimization using defect clustering information , 1992, [1992] Digest of Papers. FTCS-22: The Twenty-Second International Symposium on Fault-Tolerant Computing.
[12] Edward J. McCluskey,et al. IC qualityd and test transparency , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.