论文信息 - A simple approach of measuring inverse photoemission spectra with high resolution and high efficiency

A simple approach of measuring inverse photoemission spectra with high resolution and high efficiency

A relatively simple and inexpensive inverse photoemission spectrometer (IPS) with high resolution and high efficiency has been set up. Using this IPS, the inverse photoemission spectrum of Si(100)2×1 surface has been obtained. The resolution of the spectrum is better than 0.5eV at 9.8eV photon energy with a counting rate about 103/μASsr.

Yang Zhijian | Dai Dao-Xuan | Hu Ji-huang

[1] P. Dobson,et al. A new photon counter for inverse photoemission , 1987 .

[2] Krüger,et al. First-principles electronic structure theory for semi-infinite semiconductors with applications to Ge(001)(2 x 1) and Si(001)(2 x 1). , 1986, Physical review letters.

[3] V. Dose,et al. Improved resolution in VUV isochromat spectroscopy , 1986 .

[4] F. Himpsel,et al. Probing valence states with photoemission and inverse photoemission , 1984 .

[5] A. Marx,et al. Spectrometer for momentum‐resolved bremsstrahlung spectroscopy , 1983 .

[6] J. Kanski,et al. A Simple Apparatus for Studies of UV-Bremsstrahlung , 1982 .

[7] G. Chauvet,et al. Inverse photoemission spectrometer in the range 20–100 eV , 1981 .

[8] V. Dose. VUV isochromat spectroscopy , 1977 .