New application of holography and interferometry in temperature sensing
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A new application of holography and interferometry in temperature sensing is proposed in this paper. Using holographic technique and electron lithography, a grating can be made in a fiber's end. This structure can be used to test the temperature change. By examining the interfering pattern of diffract lights of the grating, the temperature change can be calculated. If using the work wavelength of 1.55micrometers , the temperature testing range can theoretically be 1179 degree(s)C.
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