The Future: Plug and Pray?

In his keynote speech at the 1998 International Test Conference, held last November in Washington, D.C., the author presented a view of our increasing dependence on electronic systems and the impact this is likely to have on the way we design and test new products. Here, he summarizes his major points.

[1]  R. Schaller,et al.  Moore's law: past, present and future , 1997 .

[2]  C. Prahalad,et al.  Competing for the Future , 1994 .

[3]  S. Rudkin,et al.  The Internet — past, present and future , 1997 .

[4]  Colin M. Maunder.  A universal framework for managed built-in test , 1993, Proceedings of IEEE International Test Conference - (ITC).

[5]  John W. Sheppard,et al.  The impact of commercial off-the-shelf (COTS) equipment on system test and diagnosis , 1993, Proceedings of IEEE International Test Conference - (ITC).

[6]  D. Richard Kuhn,et al.  Sources of Failure in the Public Switched Telephone Network , 1997, Computer.