Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K
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X. Garros | M. Cassé | M. Vinet | A. Juge | T. Meunier | E. Vincent | S. Franceschi | P. Galy | F. Gaillard | L. Contamin | L. Contamin | S. D. Franceschi