论文信息 - Scanning Proton-Induced X-ray Microspectrometry in an Atmospheric Environment

Scanning Proton-Induced X-ray Microspectrometry in an Atmospheric Environment

Collimated million-electron-volt proton beams, brought out into air, can be used as a scanning microprobe to examine specimens with a spatial resolution of the order of 1 micrometer. Trace elements at concentrations as low as 1 part per million can be detected. Some preliminary results based on the use of this simple method are presented.

P. Horowitz | L. Grodzins | Paul Horowitz | Lee Grodzins

[1] J. Borggreen,et al. Sensitivity in trace-element analysis by p, α and 16O induced X-rays , 1974 .

[2] P. Horowitz,et al. A Scanning X-Ray Microscope Using Synchrotron Radiation , 1972, Science.

[3] J. Cookson,et al. Proton microbeams, their production and use , 1972 .

[4] P. Feeney,et al. Sensitivity versus target backings for elemental analysis by alpha excited X-ray emission , 1972 .

[5] Roland Akselsson,et al. X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level , 1970 .

[6] W. Bonner,et al. The Flying-Spot Monochromatic Ultra-Violet Television Microscope , 1956, Nature.

[7] V. Cosslett,et al. Micro-analysis by a Flying-Spot X-Ray Method , 1956, Nature.