Observation of overstrain in the coalescence zone of AlAs/AlOx oxidation fronts
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A. Monmayrant | Alexandre Arnoult | Chantal Fontaine | O. Gauthier-Lafaye | Guilhem Almuneau | O. Gauthier-Lafaye | A. Monmayrant | C. Fontaine | A. Arnoult | G. Almuneau | F. Chouchane | Guy Lacoste | F. Chouchane | G. Lacoste
[1] Nick Holonyak,et al. AlxGa1−xAs–GaAs metal–oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs , 1995 .
[2] N. Vodjdani,et al. Huge birefringence in selectively oxidized GaAs/AlAs optical waveguides , 1996 .
[3] K. Bertness,et al. EBSD Measurement of strains in GaAs due to oxidation of buried AlGaAs layers , 2004 .
[4] Roger Fabian W. Pease,et al. Self‐limiting oxidation for fabricating sub‐5 nm silicon nanowires , 1994 .
[5] P. Puech,et al. Local stress measurements in laterally oxidized GaAs/AlxGa1−xAs heterostructures by micro-Raman spectroscopy , 1997 .
[6] M. Warren,et al. Buried refractive microlenses formed by selective oxidation of AlGaAs , 1996 .
[7] Kent D. Choquette,et al. Selective oxidation of buried AlGaAs versus AlAs layers , 1996 .
[8] Nishan Canagarajah,et al. Mode selection algorithms for enhanced spatiotemporal error concealment , 2006 .
[9] A. N. Smirnov,et al. Stresses in selectively oxidized GaAs/(AlGa)xOy structures , 2005 .
[10] M P C M Krijn,et al. Heterojunction band offsets and effective masses in III-V quaternary alloys , 1991 .
[11] Kent D. Choquette,et al. Nanoscale materials characterization of degradation in VCSELs , 2003, SPIE OPTO.
[12] G. Assanto,et al. Form birefringence phase matching in multilayer semiconductor waveguides: tuning and tolerances , 2005, IEEE Journal of Quantum Electronics.
[13] D. W. Kisker,et al. Microstructure of AlGaAs‐oxide heterolayers formed by wet oxidation , 1996 .
[14] D. Deppe,et al. Native-Oxide Defined Ring Contact for Low Threshold Vertical-Cavity Lasers , 1994 .
[15] J. Morgan,et al. Mounting-induced strain threshold for the degradation of high-power AlGaAs laser bars , 2002, IEEE Photonics Technology Letters.