论文信息 - Determination of wave noise sources using spectral parametric modeling

Determination of wave noise sources using spectral parametric modeling

We measure transistor noise power density and compute the Fourier's transform. Finally, spectral parametric modeling is used to extract noise waves correlation matrix. Results obtained by this new method has been experimentally compared with a conventional method.

D. Pasquet | A. Boudiaf | E. Bourdel | T. Werling

[1] A. Cappy,et al. Noise modeling and measurement techniques (HEMTs) , 1988 .

[2] W. M. Carey,et al. Digital spectral analysis: with applications , 1986 .

[3] K. Hartmann,et al. Noise characterization of linear circuits , 1976 .

[4] T. Lo,et al. Using linear and nonlinear predictors to improve the computational efficiency of the FD-TD algorithm , 1994 .

[5] W.J.R. Hoefer,et al. Autoregressive (AR) and autoregressive moving average (ARMA) spectral estimation techniques for faster TLM analysis of microwave structures , 1994 .

[6] S. W. Wedge,et al. Wave techniques for noise modeling and measurement , 1992 .

[7] Francois Danneville,et al. A new method for on wafer noise measurement , 1993 .

[8] R. P. Hecken,et al. Analysis of Linear Noisy Two-Ports Using Scattering Waves , 1981 .

[9] W. Dahlke,et al. Theory of Noisy Fourpoles , 1956, Proceedings of the IRE.