Surface area analysis of dental implants using micro-computed tomography.
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Rudolf Seemann | Michael Figl | Johann Kastner | Rolf Ewers | Kurt Schicho | Felix Wanschitz | Arne Wagner | Georg Enislidis | Gerhard Undt | M. Figl | R. Ewers | K. Schicho | A. Wagner | G. Undt | R. Seemann | J. Kastner | F. Wanschitz | G. Enislidis | Roman Klingesberger | R. Klingesberger
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