Boundary condition independent dynamic compact models of packages and heat sinks from thermal transient measurements

In this paper a methodology developed for the generation of transient compact models of packages and heat sinks from measured thermal transient results is described. The main advantage of generating dynamic compact models solely from measured results is the time-gain: the lengthy transient simulations, suggested by the DELPHI methodology can be omitted. After summarizing the procedure of generating the compact models of packages and heat sinks from measurements the use of the obtained dynamic compact package models in board level simulators, extended with the feature of calculating with compact models is presented.

[1]  V. Székely,et al.  Fine structure of heat flow path in semiconductor devices: a measurement and identification method , 1988 .

[2]  H. Vinke,et al.  A novel approach for the thermal characterization of electronic parts , 1995, Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

[3]  A. Bar-Cohen,et al.  Thermal characterization of chip packages-evolutionary development of compact models , 1997, Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium.

[4]  Bart Vandevelde,et al.  A generic methodology for deriving compact dynamic thermal models, applied to the PSGA package , 1998, IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A.

[5]  P. Stehouwer,et al.  Creation and evaluation of compact models for thermal characterisation using dedicated optimisation software , 1999, Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306).

[6]  Marta Rencz,et al.  Realization of an electronically controlled thermal resistance , 2000 .

[7]  Andras Poppe,et al.  THERMAN: a thermal simulation tool for IC chips, microstructures and PW boards , 2000 .

[8]  Marta Rencz,et al.  Dynamic thermal multiport modeling of IC packages , 2001 .

[9]  M. Rencz,et al.  Co-simulation of dynamic compact models of packages with the detailed models of printed circuit boards , 2002, 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium.

[10]  M. Rencz,et al.  Determining partial thermal resistances with transient measurements, and using the method to detect die attach discontinuities , 2002, Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2002 (Cat.No.02CH37311).

[11]  M. Rencz,et al.  A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements , 2003, IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003..

[12]  E.G.T. Bosch Thermal compact models: an alternative approach , 2003 .

[13]  A. Poppe,et al.  Dynamic compact models of cooling mounts for fast board level design , 2003, Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003..

[14]  A. Morelli,et al.  Thermal transient modeling and experimental validation in the European project PROFIT , 2004, IEEE Transactions on Components and Packaging Technologies.