Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response
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R. L. Pease | T. L. Turflinger | Ronald D. Schrimpf | Hugh J. Barnaby | P. Cole | M. C. Maher | D. O. Van Nort | M. Gehlhausen | S. C. Witczak | D. Emily | J. Titus | J. Krieg
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