A 1 ps-resolution integrator-based time-to-digital converter using a SAR-ADC in 90nm CMOS

We propose a time-to-digital converter (TDC) that uses a Gm-C integrator to translate the time interval into voltage, and quantizes this voltage with a SAR-ADC. The proposed method is capable of achieving pico-second resolution, avoiding limitations in delay-chain-based TDCs, such as limited resolution to the buffer delay, mismatches, and voltage surge. Furthermore, taking the advantages of SAR-ADC, small area and low power consumption of voltage quantization are attainable. The chip was fabricated in 90nm CMOS. Its measured DNL and INL are -0.6/0.7 LSB and -1.1/2.3 LSB, respectively, with 1ps per LSB in a 9-bit range.

[1]  Chun-Chi Chen,et al.  A PVT Insensitive Vernier-Based Time-to-Digital Converter With Extended Input Range and High Accuracy , 2007, IEEE Transactions on Nuclear Science.

[2]  Hong-June Park,et al.  A 0.63ps resolution, 11b pipeline TDC in 0.13µm CMOS , 2011, 2011 Symposium on VLSI Circuits - Digest of Technical Papers.

[3]  Daehwa Paik,et al.  A low-noise self-calibrating dynamic comparator for high-speed ADCs , 2008, 2008 IEEE Asian Solid-State Circuits Conference.

[4]  J. Kostamovaara,et al.  An integrated time-to-digital converter with 30-ps single-shot precision , 2000, IEEE Journal of Solid-State Circuits.

[5]  Salvatore Levantino,et al.  Time-to-digital converter with 3-ps resolution and digital linearization algorithm , 2010, 2010 Proceedings of ESSCIRC.

[6]  Paul Leroux,et al.  Design and Assessment of a 6 ps-Resolution Time-to-Digital Converter With 5 MGy Gamma-Dose Tolerance for LIDAR Application , 2012, IEEE Transactions on Nuclear Science.

[7]  A. Matsuzawa Analog and RF circuits design and future devices interaction , 2012, 2012 International Electron Devices Meeting.