论文信息 - Investigation of non-independent single event upsets in the TAOS GVSC static RAM - 字舞流文

Investigation of non-independent single event upsets in the TAOS GVSC static RAM

Operation of the two TAOS Honeywell GVSC Flight Computers has been monitored over three years. SEUs in the Micron 32K/spl times/8 static RAM chips were characterized and some were found to have a common primary event.

R. Koga | B. Wilson | R. Hosken | J. Marcelli | L. Laird

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