论文信息 - A LabVIEW based automatic test system for sieving chips

A LabVIEW based automatic test system for sieving chips

Abstract The present trend for Complementary Metal Oxide Semiconductor (CMOS) chip designs is smaller in size and power consumption with multifunction. This results the difficulty for the testing engineer, especially for small amount production without an automatic probe station, to complete such task. In order to reduce the workload of the engineer, improve the testing efficiency and accuracy, a LabVIEW based automatic test system for such CMOS chip has been designed in this paper. The details of the overall system which includes the setup of the testing by using a PXI (PCI extensions for instrumentation) system with Data Acquisition (DAQ) and Source Measure Units (SMUs) module, and the LabVIEW based automatic testing program has been introduced in this paper. The testing results have shown that this system is able to improve the testing efficiency with great accuracy, at the same time to evaluate the testing results in real-time. Due to the software is built on different modules, and it is therefore easy to be extended for different applications.

Yongheng Shang | Zhongyuan Wang | Jiarui Liu | Xidong Wu

[1] S. Cecchini,et al. The positioning system of the ANTARES Neutrino Telescope , 2012, 1202.3894.

[2] D N Vizireanu,et al. A fast, simple and accurate time-varying frequency estimation method for single-phase electric power systems , 2012 .

[3] S. Stock. Architecting Distributed PXI Test Systems , 2006, 2006 IEEE Autotestcon.

[4] Luigi Carro,et al. INL and DNL estimation based on noise for ADC test , 2004, IEEE Transactions on Instrumentation and Measurement.

[5] Simona Halunga,et al. Analytical formula for three points sinusoidal signals amplitude estimation errors , 2012 .

[6] Jeffrey Travis,et al. LabVIEW for Everyone: Graphical Programming Made Easy and Fun , 2006 .

[7] L. Gutterman. Integrating VISA, IVI and ATEasy to migrate legacy test systems , 2004, Proceedings AUTOTESTCON 2004..

[8] Degang Chen,et al. Testing of Precision DAC Using Low-Resolution ADC With Wobbling , 2008, IEEE Transactions on Instrumentation and Measurement.

[9] D N Vizireanu,et al. Simple, fast and accurate eight points amplitude estimation method of sinusoidal signals for DSP based instrumentation , 2012 .

[10] V. Natarajan,et al. Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation , 2009, 2009 14th IEEE European Test Symposium.

[11] Jiun-Lang Huang,et al. ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling , 2011, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.