论文信息 - Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures. - 字舞流文

Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures.

George T. Wang | P. Lu | Kevin S. Jones | K. Sapkota | C. Hatem | Emily M Turner | K. Jones | Emily M. Turner