A Benchmark System for Comparing Reliability Modeling Approaches for Digital Instrumentation and Control Systems
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Diego Mandelli | Sergio Guarro | Eylem Ekici | Paolo Bucci | Jason Kirschenbaum | Tunc Aldemir | Michael Stovsky | Michael Yau | Steven A. Arndt | E. Ekici | S. Arndt | T. Aldemir | D. Mandelli | P. Bucci | J. Kirschenbaum | M. Stovsky | S. Guarro | M. Yau
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