论文信息 - A submicron precision silicon telescope for beam test purposes

A submicron precision silicon telescope for beam test purposes

Abstract A precise and compact silicon microstrip detector telescope designed to provide reference information for charged particle tracks has been constructed. First operation results are presented. A signal over noise ratio higher than 100 has been obtained, resulting in a spatial resolution of 1.4 μm per detector, for a readout pitch of 50 μm. At a position in the center of the telescope, a track extrapolation error of 0.7 μm can be obtained for reconstructed tracks.

[1] M. Habrard,et al. Large scale pixel detectors for DELPHI at LEP200 and ATLAS at LHC , 1994 .

[2] S. Masciocchi,et al. VIKING, a CMOS low noise monolithic 128 channel frontend for Si-strip detector readout , 1994 .

[3] R. Turchetta,et al. Spatial resolution of silicon microstrip detectors , 1993 .

[4] P. Jarron,et al. The silicon micropattern detector: A dream? , 1988 .

[5] P. Weilhammer,et al. Measurement of spatial resolution of a double-sided AC-coupled microstrip detector , 1991 .

[6] R. Gray,et al. Gallium arsenide microstrip detectors for charged particles , 1992 .

[7] G. Lutz. Optimum track fitting in the presence of multiple scattering , 1988 .

[8] Double-sided Si strip sensors for LEP vertex detectors , 1994 .

[9] A. Oed,et al. Position-sensitive detector with microstrip anode for electron multiplication with gases☆ , 1988 .

[10] R. Horisberger,et al. Beam test results from a prototype for the delphi microvertex detector , 1990 .