Power, Performance, Area and Cost Analysis of Memory-on-Logic Face-to-Face Bonded 3D Processor Designs
暂无分享,去创建一个
Francky Catthoor | Dragomir Milojevic | Alberto García Ortiz | Manu Perumkunnil | Anthony Agnesina | Sung Kyu Lim | Jinwoo Kim | Moritz Brunion | S. Lim | F. Catthoor | A. Ortiz | Anthony Agnesina | M. Perumkunnil | D. Milojevic | Jinwoo Kim | Moritz Brunion
[1] Israel Koren,et al. Defect tolerance in VLSI circuits: techniques and yield analysis , 1998, Proc. IEEE.
[2] Geert Vandenberghe,et al. The economic impact of EUV lithography on critical process modules , 2014, Advanced Lithography.
[3] O. O. Okudur,et al. Scalable, sub 2μm pitch, Cu/SiCN to Cu/SiCN hybrid wafer-to-wafer bonding technology , 2017, 2017 IEEE International Electron Devices Meeting (IEDM).
[4] Yuan Xie,et al. Cost-effective integration of three-dimensional (3D) ICs emphasizing testing cost analysis , 2010, 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
[5] Paola Annoni,et al. Variance based sensitivity analysis of model output. Design and estimator for the total sensitivity index , 2010, Comput. Phys. Commun..
[6] D.K. de Vries,et al. Investigation of gross die per wafer formulas , 2005, IEEE Transactions on Semiconductor Manufacturing.
[7] Diederik Verkest,et al. Maintaining Moore’s law: enabling cost-friendly dimensional scaling , 2015, Advanced Lithography.
[8] Jonathan Balkind,et al. OpenPiton + Ariane : The First Open-Source , SMP Linux-booting RISC-V System Scaling From One to Many Cores , 2019 .
[9] A. Ferris-Prabhu. An algebraic expression to count the number of chips on a wafer , 1989, IEEE Circuits and Devices Magazine.
[10] Yuan Xie,et al. System-level cost analysis and design exploration for three-dimensional integrated circuits (3D ICs) , 2009, 2009 Asia and South Pacific Design Automation Conference.
[11] Alberto García Ortiz,et al. Macro-3D: A Physical Design Methodology for Face-to-Face-Stacked Heterogeneous 3D ICs , 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).
[12] Sung Kyu Lim,et al. How much cost reduction justifies the adoption of monolithic 3D ICs at 7nm node? , 2016, 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).